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	Medium Energy Ion Scattering Model DP-MEIS15 The Medium Energy Ion Scattering technique can give unprecedented information on surface composition of thin films. In simple terms, MEIS consists of a pulsed ion beam (typically between 10 and 30keV energy), the sample, and an ion detector. The technique takes advantage of the fact that the impinging ions are backscattered off the top layer of the sample with an energy loss characteristic of the element with which the incident ion collides. This energy loss translates into a loss of scalar momentum which, with a time-sensitive detector, can produce a time-of-flight (TOF) spectrum. Oxford Applied Research offers a bolt-on, compact MEIS system which can be used for in-house studies, freeing researchers from the time-constraints of National MEIS facilities. The DP-MEIS15 system can produce high-quality data in a matter of seconds, allowing real-time studies of thin film growth. The instrument can also be used in recoil mode whereby near-surface light elements/species are removed by heavy glancing   incident ions (e.g. Ar+) and captured by a separate detector Specification 15 keV beam(max) <15 ns pulse width Differential pumping port <1 in 20 a.m.u mass resolution Ion species: He , He , Ne+ , Ne2+ , Ne3+ ... ExB mass separation of ion species Data acquisition system Co-axial backscattering to 50 s:A typical beam current (species dependent) Multi-charged species The ion source produces appreciable currents of multi-charged species such as Ne2+ and Ne3+. Using the ExB mass separator, these species can be used to produce beams with up to 45 keV energy. Real-time Data Using the TOF-MEIS system, quality data can be obtained in seconds; samples can be monitored in real-time during film growth. The spectrum on the right, of a superconducting oxide film, was obtained in less than 10 seconds. Dimensions and Services Mounting: NW100CF or customer-specific >System length: 995mm Gas supply: Standard gas line (in-vacuum high-voltage isolation) Pumping: Two differential pumping ports Detector: co-axial microsphere plate (MSP) detector All power supplies and cables included for: Ion source, Beam, Focus, X&Y Beam pulsing Detector EXB Mass Separator Click here to download MEIS brochure in pdf format.
Last updated: 12 February 2010 Copyright 2008 The Vacutec Group Home About Us News Conferences Contact Technical Support